The Microscopy Society of America (MSA) has honored Professor ZHOU Wu, a Professor at the School of Physical Sciences and Director of the Electron Microscopy Center at the University of Chinese Academy of Sciences (UCAS), with the 2024 Burton Medal in Physical Sciences. This award recognizes his outstanding contributions to the development and application of low-voltage single-atom electron microscopy techniques in materials science.
Throughout his career, Professor ZHOU has pushed the frontiers of quantitative low-voltage scanning transmission electron microscopy (STEM) imaging and electron energy-loss spectroscopy (EELS) techniques. His pioneering work has enabled the direct observation and analysis of materials at the single-atom level, providing crucial insights into atomic-scale structures and functionalities. His research has significantly advanced our understanding of two-dimensional (2D) materials, quantum materials, and heterogeneous catalysts, particularly in revealing how atomic structures and chemical properties influence material performance.
The Burton Medal, one of the most prestigious awards in electron microscopy, has been awarded annually since 1975 to a single scientist under the age of 40 who has made distinguished contributions to the field of microscopy and microanalysis. Notably, Professor ZHOU is the first researcher based in China to receive this esteemed honor, joining a select group of seven Chinese scholars who have been recognized over the past 50 years.
Professor ZHOU's receipt of this award is a major recognition by the international microscopy community of his exceptional achievements and impact in the fields of electron microscopy and materials science.
The award was officially presented during the Society Awards Ceremony at the plenary session marking the opening of the Microscopy & Microanalysis 2024 conference (M&M 2024), held in Cleveland, Ohio, from July 28 to August 1, 2024. The conference attracted more than 1600 attendees worldwide.
For more information, visit the MSA's official site and the press release by the Microscopy Society of America.
Author: School of Physical Sciences
Editor: GAO Yuan
