Latest News
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Alumnus of UCAS Invited to the 70th Anniversary Celebration of the Establishment of the Xinjiang Uygur Autonomous Region
Recently, the 70th Anniversary Celebration of the Establishment of the Xinjiang Uygur Autonomous Region was grandly held in Xinjiang. Representatives from all walks of life gathered together to witness this important moment that carries glory and dreams. Akash Tariq, an alumnus of the International College of the University of Chinese Academy of Sciences (hereinafter referred to as "UCAS"), was invited to attend the ceremony.
Akash Tariq at the celebration site
After obtaining his doctoral degree from UCAS, Akash Tariq took up a position at the Xinjiang Institute of Ecology and Geography, Chinese Academy of Sciences (abbreviated as "Xinjiang Institute of Ecology and Geography"). He previously won the "Tianshan Award" of the Xinjiang Uygur Autonomous Region. Invited to the celebration this time, he said excitedly, "Standing at the celebration site and seeing the fruitful achievements of Xinjiang's development over the past 70 years, my heart is filled with pride and emotion. This is not only the result of the joint efforts of people of all ethnic groups in Xinjiang, but also a vivid reflection of the country's prosperity and development. As an alumnus of the International College of UCAS, the college's concept of 'serving the country through science and education and contributing to society' has always inspired me. In the future, I will continue to give full play to my strengths and contribute more to national development and regional construction."
The International College of UCAS is committed to building a high-level platform for cultivating international talents. Adhering to the concept of "gathering talents from all over the world and putting them to good use", it vigorously carries out work related to international student alumni and encourages international students to build bridges for Sino-foreign scientific and technological cooperation and cultural exchanges after graduation.
Source: IC-UCAS
Editor: GAO Yuan
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Research News
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Chinese Scientists Uncover Diamond’s Electrical Failure Mechanism
A research team from the University of Chinese Academy of Sciences has revealed the failure mechanism of diamond under extreme electrical fields through in situ experiments and molecular dynamics simulations. The study, published in Cell Reports Physical Science, provides critical insights for the design of next-generation diamond-based high-power electronic devices.
Diamond is known for its exceptional physical properties, including ultra-high breakdown field strength and thermal conductivity, making it a promising material for high-frequency and high-power electronics. However, its failure process under extreme electrical fields has remained poorly understood—until now.
The team, led by Professors YAN Qingbo and CHEN Guangchao, used an in situ transmission electron microscopy (TEM) method to observe the breakdown process in real time. They found that diamond failure begins preferentially along the (111) crystal plane, driven by stress-induced lattice distortion and subsequent amorphization, rather than transforming into graphite.
The researchers also used molecular dynamics (MD) simulations to confirm that the (111) surface is more prone to thermal collapse under high temperatures, aligning perfectly with their experimental observations. This study not only clarifies the crystallographic dependency of diamond’s electrical failure but also suggests that using (100)- or (110)-oriented diamond exposed substrates could significantly enhance device durability.
This study not only deepens the understanding of diamond’s behavior under extreme conditions but also opens new pathways for more durable diamond-based electronic devices.
The team said that the findings are expected to influence the design and material selection of diamond-based devices in fields such as quantum computing, high-power transistors, and ultraviolet lasers.
Editor: GAO Yuan
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